| Title | Atomistic Simulation Derived Insight on the Irreversible Structural Changes of Si Electrode during Fast and Slow Delithiation |
| Publication Type | Journal Article |
| Year of Publication | 2017 |
| Authors | Kim, KJin, Wortman, J, Kim, S-Y, Qi, Y |
| Journal | Nano Letters |
| Volume | 17 |
| Issue | 7 |
| Start Page | 4330 |
| Pagination | 4330-4338 |
| Date Published | 06/2017 |
| URL | http://dx.doi.org/10.1021/acs.nanolett.7b01389 |
| DOI | 10.1021/acs.nanolett.7b01389 |
Atomistic Simulation Derived Insight on the Irreversible Structural Changes of Si Electrode during Fast and Slow Delithiation
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